Atom-Probe Tomography, 2014 The Local Electrode Atom Probe
Auteurs : Miller Michael K., Forbes Richard G.
Nanocharacterization by Atom Probe Tomography is a practical guide for researchers interested atomic level characterization of materials with atom probe tomography.
Readers will find descriptions of the atom probe instrument and atom probe tomography technique, field ionization, field evaporation and field ion microscopy. The fundamental underlying physics principles are examined, in addition to data reconstruction and visualization, statistical data analysis methods and specimen preparation by electropolishing and FIB-based techniques. A full description of the local electrode atom probe ? a new state-of-the-art instrument ? is also provided, along with detailed descriptions and limitations of laser pulsing as a method to field evaporate atoms. Valuable coverage of the new ionization theory is also included, which underpins the overall technique.
Introduction to Atom Probe Tomography.- Introduction to the Physics of Field Ion Emitters.- Field Evaporation and Related Topics.- The Art of Specimen Preparation.- The Local Electrode Atom Probe.- Data Reconstruction.- Data Analysis.- Appendices.
Serves as a practical guide for the operation of the technique and analysis of the data
Covers state-of-the-art instrumentation and theories
Includes new and revised data analysis methods and applications
Includes supplementary material: sn.pub/extras
Date de parution : 09-2016
Ouvrage de 423 p.
15.5x23.5 cm
Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).
Prix indicatif 158,24 €
Ajouter au panierDate de parution : 08-2014
Ouvrage de 423 p.
15.5x23.5 cm
Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).
Prix indicatif 158,24 €
Ajouter au panier