Advances in Imaging and Electron Physics Advances in Imaging and Electron Physics Series
Coordonnateurs : Hÿtch Martin, Hawkes Peter W.
Preface Martin Hÿtch and Peter W. Hawkes 1. Measuring elastic strains and orientation gradients by scanning electron microscopy: Conventional and emerging methods Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 2. Development of a global homography-based approach for high-angular resolution in the SEM Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 3. Implementing the homography-based global approach Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 4. Numerical validation and influence of optical distorsions on accuracy Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger, Vincent Taupin and Emmanuel Bouzy 5. Applications of the method Clément Ernould, Benoît Beausir, Jean-Jacques Fundenberger,Vincent Taupin and Emmanuel Bouzy 6. Spin wave physics: The nonlinear spin wave-electromagnetic interaction and implications for high frequency devices Clifford M. Krowne
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
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Date de parution : 08-2022
Ouvrage de 266 p.
15.2x22.8 cm
Thèmes d’Advances in Imaging and Electron Physics :
Mots-clés :
Accuracy; EBSD; Elastic strains; Ferrite magnetic materials; GND; Grain internal disorientation; High-angular resolution; Homography; HR-EBSD; HR-TKD; IC-GN; Indexing; Limiters; Limiting electromagnetic (EM) signals from antennas; Magnetodynamic equations of motion; Nanostructure; Nonlinear interaction; Optical distortion; Orientation imaging microscopy; Scanning electron microscopy; Spin waves; TKD