TOF-SIMS : Materials analysis by mass spectrometry (2^nd Ed.)

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is the most versatile of the surface analysis techniques that have been developed during the last 30 years. Current instrumentation provides a powerful combination of capabilities for molecular detection and trace element determination, imaging in two and three dimensions, and microanalysis.

This is the Second Edition of the first book to be dedicated to the subject and the treatment is comprehensive. Following overview and historical chapters, there are sections devoted to instrumentation and sample handling, fundamentals and molecular dynamics simulations, optimisation methods–including laser post-ionisation of sputtered neutrals, data interpretation and analytical applications.