Scanning Electron Microscopy and X-Ray Microanalysis (4th Ed., 4th ed. 2018)
Auteurs : Goldstein Joseph I., Newbury Dale E., Michael Joseph R., Ritchie Nicholas W.M., Scott John Henry J., Joy David C.
- Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers
- Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results
- Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements
- Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation.
- Includes case studies to illustrate practical problem solving
- Covers Helium ion scanning microscopy
- Organized into relatively self-contained modules ? no need to "read it all" to understand a topic
- Includes an online supplement?an extensive "Database of Electron?Solid Interactions"?which can be accessed on SpringerLink, in Chapter 3
Realigns the text with the needs of a diverse audience from researchers and graduate students to SEM operators and technical managers
Emphasizes practical, hands-on operation of the microscope, particularly user selection of the critical operating parameters to achieve meaningful results
Provides step-by-step overviews of SEM, EDS, and EBSD and checklists of critical issues for SEM imaging, EDS x-ray microanalysis, and EBSD crystallographic measurements
Makes extensive use of open source software: NIH ImageJ-FIJI for image processing and NIST DTSA II for quantitative EDS x-ray microanalysis and EDS spectral simulation
Includes case studies to illustrate practical problem solving
Covers Helium ion scanning microscopy
Organized into relatively self-contained modules – no need to "read it all" to understand a topic
Date de parution : 08-2018
Ouvrage de 550 p.
21x27.9 cm
Disponible chez l'éditeur (délai d'approvisionnement : 15 jours).
Prix indicatif 105,49 €
Ajouter au panierDate de parution : 11-2017
Ouvrage de 550 p.
21x27.9 cm
Thèmes de Scanning Electron Microscopy and X-Ray Microanalysis :
Mots-clés :
EBSD; Electron backscatter diffraction; Environmental SEM; Focused ion beam; Ion beam microanalysis; Qualitative X-ray analysis; Quantitative X-ray analysis; SDD x-ray detectors; SEM textbook; Table top SEM; Variable pressure SEM; X-ray mapping; X-ray microanalysis book; X-ray spectral measurement; dual column instruments; Biological Microscopy